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Three-dimensional profiling with binary fringes using phase-shifting interferometry algorithms |
Applied Optics, Vol. 50, Issue 2, pp. 147-154 (2011)
http://dx.doi.org/10.1364/AO.50.000147
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Abstract
Three-dimensional shape measurements by sinusoidal fringe projection using phase-shifting interferometry algorithms are distorted by the nonlinear response in intensity of commercial video projectors and digital cameras. To solve the problem, we present a method that consists in projecting and acquiring a temporal sequence of strictly binary patterns, whose (adequately weighted) average leads to a sinusoidal fringe pattern with the required number of bits. Since binary patterns consist of “ones” and “zeros”—and no half-tones are involved—the nonlinear response of the projector and the camera will not play a role, and a nearly unit contrast gray-level sinusoidal fringe pattern is obtained. Validation experiments are presented.
© 2011 Optical Society of America
OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: September 23, 2010
Revised Manuscript: November 12, 2010
Manuscript Accepted: November 17, 2010
Published: January 6, 2011
Citation
Gastón A. Ayubi, J. Matías Di Martino, Julia R. Alonso, Ariel Fernández, César D. Perciante, and José A. Ferrari, "Three-dimensional profiling with binary fringes using phase-shifting interferometry algorithms," Appl. Opt. 50, 147-154 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-2-147
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