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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 2 — Jan. 10, 2011
  • pp: 147–154

Three-dimensional profiling with binary fringes using phase-shifting interferometry algorithms

Gastón A. Ayubi, J. Matías Di Martino, Julia R. Alonso, Ariel Fernández, César D. Perciante, and José A. Ferrari  »View Author Affiliations


Applied Optics, Vol. 50, Issue 2, pp. 147-154 (2011)
http://dx.doi.org/10.1364/AO.50.000147


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Abstract

Three-dimensional shape measurements by sinusoidal fringe projection using phase-shifting interferometry algorithms are distorted by the nonlinear response in intensity of commercial video projectors and digital cameras. To solve the problem, we present a method that consists in projecting and acquiring a temporal sequence of strictly binary patterns, whose (adequately weighted) average leads to a sinusoidal fringe pattern with the required number of bits. Since binary patterns consist of “ones” and “zeros”—and no half-tones are involved—the nonlinear response of the projector and the camera will not play a role, and a nearly unit contrast gray-level sinusoidal fringe pattern is obtained. Validation experiments are presented.

© 2011 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: September 23, 2010
Revised Manuscript: November 12, 2010
Manuscript Accepted: November 17, 2010
Published: January 6, 2011

Citation
Gastón A. Ayubi, J. Matías Di Martino, Julia R. Alonso, Ariel Fernández, César D. Perciante, and José A. Ferrari, "Three-dimensional profiling with binary fringes using phase-shifting interferometry algorithms," Appl. Opt. 50, 147-154 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-2-147

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