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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 20 — Jul. 10, 2011
  • pp: 3435–3441

Temperature field analysis of single layer T i O 2 film components induced by long-pulse and short-pulse lasers

Bin Wang, Hongchao Zhang, Yuan Qin, Xi Wang, Xiaowu Ni, Zhonghua Shen, and Jian Lu  »View Author Affiliations


Applied Optics, Vol. 50, Issue 20, pp. 3435-3441 (2011)
http://dx.doi.org/10.1364/AO.50.003435


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Abstract

To study the differences between the damaging of thin film components induced by long-pulse and short-pulse lasers, a model of single layer TiO 2 film components with platinum high-absorptance inclusions was established. The temperature rises of TiO 2 films with inclusions of different sizes and different depths induced by a 1 ms long-pulse and a 10 ns short-pulse lasers were analyzed based on temperature field theory. The results show that there is a radius range of inclusions that corresponds to high temperature rises. Short-pulse lasers are more sensitive to high-absorptance inclusions and long-pulse lasers are more easily damage the substrate. The first-damage decision method is drawn from calculations.

© 2011 Optical Society of America

OCIS Codes
(140.3330) Lasers and laser optics : Laser damage
(140.6810) Lasers and laser optics : Thermal effects
(310.6870) Thin films : Thin films, other properties

ToC Category:
Lasers and Laser Optics

History
Original Manuscript: March 2, 2011
Revised Manuscript: May 6, 2011
Manuscript Accepted: May 17, 2011
Published: July 1, 2011

Citation
Bin Wang, Hongchao Zhang, Yuan Qin, Xi Wang, Xiaowu Ni, Zhonghua Shen, and Jian Lu, "Temperature field analysis of single layer TiO2film components induced by long-pulse and short-pulse lasers," Appl. Opt. 50, 3435-3441 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-20-3435

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