|
Measurement of a cross-sectional profile of a thread gauge using a sinusoidally vibrating interference pattern |
Applied Optics, Vol. 50, Issue 20, pp. 3470-3474 (2011)
http://dx.doi.org/10.1364/AO.50.003470
Enhanced HTML 
Acrobat PDF (522 KB)
Abstract
A sinusoidally vibrating interference pattern (SVIP) is used as an exact spatial scale in order to measure a cross-sectional profile of a thread gauge. The SVIP is projected on the thread gauge surface, and lights diffracted and reflected from the end points of the thread gauge surface are extracted by spatial frequency filtering in an imaging system to make an image of the end points whose positions are decided by the peak positions of amplitude distributions in the image. The coordinates of the end points or the cross-sectional profile of the thread gauge is obtained from the phases measured at the positions of the end points, phase distribution of the SVIP on a CCD image sensor, and the pixel positions of the CCD image sensor.
© 2011 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: March 24, 2011
Revised Manuscript: May 16, 2011
Manuscript Accepted: May 17, 2011
Published: July 5, 2011
Citation
Jinhuan Li and Osami Sasaki, "Measurement of a cross-sectional profile of a thread gauge using a sinusoidally vibrating interference pattern," Appl. Opt. 50, 3470-3474 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-20-3470
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Wave-Front Sensing with a Sampling Field Sensor (AO)
- Method for Edge Detection Based on Phase Jump in a Differential Interferometer (AO)
- Improved Angle Interferometer Based on Total Internal Reflection (AO)
- Laser-diode interferometer with a photothermal modulation (AO)
- Design of error-compensating algorithms for sinusoidal phase shifting interferometry (AO)
Related Conference Papers
- The GEO600 Gravitational Wave Detector
- Interferometry for Space-Based Gravitational Wave Detection
- Investigation of Linewidth Enhancement Factor Variations in External Cavity and Fabry-Perot Semiconductor Lasers
- Laboratory Demonstration of Low Earth Orbit Inter-Satellite Interferometric Ranging
- The GEO600 Gravitational Wave Detector
« Previous Article | Next Article »
OSA is a member of 