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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 21 — Jul. 20, 2011
  • pp: 4068–4082

Scattering effects at near-wall flow measurements using Doppler global velocimetry

Andreas Fischer, Daniel Haufe, Lars Büttner, and Jürgen Czarske  »View Author Affiliations

Applied Optics, Vol. 50, Issue 21, pp. 4068-4082 (2011)

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Doppler global velocimetry (DGV) is considered to be a useful optical measurement tool for acquiring flow velocity fields. Often near-wall measurements are required, which is still challenging due to errors resulting from background scattering and multiple-particle scattering. Since the magnitudes of both errors are unknown so far, they are investigated by scattering simulations and experiments. Multiple-particle scattering mainly causes a stochastic error, which can be reduced by averaging. Contrary to this, background scattering results in a relative systematic error, which is directly proportional to the ratio of the background scattered light power to the total scattered light power. After applying a correction method and optimizing the measurement arrangement, a subsonic flat plate boundary layer was successfully measured achieving a minimum wall distance of 100 μm with a maximum relative error of 6%. The investigations reveal the current capabilities and perspectives of DGV for near-wall measurements.

© 2011 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(290.4210) Scattering : Multiple scattering
(290.5850) Scattering : Scattering, particles

ToC Category:

Original Manuscript: March 23, 2011
Revised Manuscript: May 20, 2011
Manuscript Accepted: May 24, 2011
Published: July 15, 2011

Virtual Issues
Vol. 6, Iss. 8 Virtual Journal for Biomedical Optics

Andreas Fischer, Daniel Haufe, Lars Büttner, and Jürgen Czarske, "Scattering effects at near-wall flow measurements using Doppler global velocimetry," Appl. Opt. 50, 4068-4082 (2011)

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