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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 21 — Jul. 20, 2011
  • pp: 4105–4114

Development of stable monolithic wide-field Michelson interferometers

Xiaoke Wan, Jian Ge, and Zhiping Chen  »View Author Affiliations

Applied Optics, Vol. 50, Issue 21, pp. 4105-4114 (2011)

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Bulk wide-field Michelson interferometers are very useful for high precision applications in remote sensing and astronomy. A stable monolithic Michelson interferometer is a key element in high precision radial velocity (RV) measurements for extrasolar planets searching and studies. Thermal stress analysis shows that matching coefficients of thermal expansion (CTEs) is a critical requirement for ensuring interferometer stability. This requirement leads to a novel design using BK7 and LAK7 materials, such that the monolithic interferometer is free from thermal distortion. The processes of design, fabrication, and testing of interferometers are described in detail. In performance evaluations, the field angle is typically 23.8 ° and thermal sensitivity is typically 2.6 × 10 6 / ° C near 550 nm , which corresponds to 800 m / s / ° C in the RV scale. Low-cost interferometer products have been commissioned in multiple RV instruments, and they are producing high stability performance over long term operations.

© 2011 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(120.6810) Instrumentation, measurement, and metrology : Thermal effects
(300.6320) Spectroscopy : Spectroscopy, high-resolution

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: February 2, 2011
Revised Manuscript: April 25, 2011
Manuscript Accepted: June 3, 2011
Published: July 18, 2011

Xiaoke Wan, Jian Ge, and Zhiping Chen, "Development of stable monolithic wide-field Michelson interferometers," Appl. Opt. 50, 4105-4114 (2011)

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