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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 22 — Aug. 1, 2011
  • pp: 4268–4275

Development of a variable launch attenuation and isolation measurement system for optical waveguides

David Ives, Robert Ferguson, and Subrena Harris  »View Author Affiliations

Applied Optics, Vol. 50, Issue 22, pp. 4268-4275 (2011)

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In this paper we describe a system that measures the attenuation and isolation of optical waveguides and has the capability to fully explore these properties over a range of reproducible launch conditions. The system allows both the launch signal spot size and numerical aperture to be varied and can be correlated to the actual operating conditions of the board. Characterization of the optical system, including the magnification factor as well as the linearity, sensitivity, spatial uniformity of the charge-coupled device cameras, is shown. Initial results from a variety of waveguides, including planar, radii, and crossover designs, are discussed and an assessment of the key uncertainty contributions of the system is presented.

© 2011 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(200.4650) Optics in computing : Optical interconnects
(250.5460) Optoelectronics : Polymer waveguides

ToC Category:
Fiber Optics and Optical Communications

Original Manuscript: April 22, 2011
Manuscript Accepted: June 13, 2011
Published: July 20, 2011

David Ives, Robert Ferguson, and Subrena Harris, "Development of a variable launch attenuation and isolation measurement system for optical waveguides," Appl. Opt. 50, 4268-4275 (2011)

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