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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 22 — Aug. 1, 2011
  • pp: 4499–4508

Numerical modeling of field-assisted ion-exchanged channel waveguides by the explicit consideration of space-charge buildup

Piotr Mrozek  »View Author Affiliations


Applied Optics, Vol. 50, Issue 22, pp. 4499-4508 (2011)
http://dx.doi.org/10.1364/AO.50.004499


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Abstract

A numerical model explicitly considering the space-charge density evolved both under the mask and in the region of optical structure formation was used to predict the profiles of Ag concentration during field-assisted Ag + Na + ion exchange channel waveguide fabrication. The influence of the unequal values of diffusion constants and mobilities of incoming and outgoing ions, the value of a correlation factor (Haven ratio), and particularly space-charge density induced during the ion exchange, on the resulting profiles of Ag concentration was analyzed and discussed. It was shown that the incorporation into the numerical model of a small quantity of highly mobile ions other than exclusively Ag + and Na + may considerably affect the range and shape of calculated Ag profiles in the multicomponent glass. The Poisson equation was used to predict the electric field spread evolution in the glass substrate. The results of the numerical analysis were verified by the experimental data of Ag concentration in a channel waveguide fabricated using a field-assisted process.

© 2011 Optical Society of America

OCIS Codes
(000.4430) General : Numerical approximation and analysis
(230.7380) Optical devices : Waveguides, channeled

ToC Category:
Optical Devices

History
Original Manuscript: April 29, 2011
Revised Manuscript: June 13, 2011
Manuscript Accepted: June 28, 2011
Published: July 27, 2011

Citation
Piotr Mrozek, "Numerical modeling of field-assisted ion-exchanged channel waveguides by the explicit consideration of space-charge buildup," Appl. Opt. 50, 4499-4508 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-22-4499

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