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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 24 — Aug. 20, 2011
  • pp: 4855–4859

Research on ultrafine particle size measurement using small amounts of data

Zhenmei Li, Jin Shen, Wei Liu, and Yajing Wang  »View Author Affiliations


Applied Optics, Vol. 50, Issue 24, pp. 4855-4859 (2011)
http://dx.doi.org/10.1364/AO.50.004855


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Abstract

The paper puts forward a new method of ultrafine particle size measurement using small amounts of data of a dynamic light-scattering signal, and establishes an arithmetic model of the measurement by wavelet package transform. First, through the wavelet package transform, the ultrafine particle dynamic light-scattering signals were decomposed into multifrequency bands. Then, the noise of signals of different frequency bands were removed and the power spectrum of the wavelet packet coefficients of each frequency band was calculated. Finally, the ultrafine particle size distribution information could be deduced from inversing the power spectrum. The standard polystyrene particles of 100, 300, and 400 nm were measured using this method, and the inversion results indicated that this method can effectively remove noise and improve the accuracy of particle size measurement using small amounts of data.

© 2011 Optical Society of America

OCIS Codes
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(290.5820) Scattering : Scattering measurements
(290.5850) Scattering : Scattering, particles

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 30, 2011
Revised Manuscript: July 9, 2011
Manuscript Accepted: July 10, 2011
Published: August 18, 2011

Virtual Issues
Vol. 6, Iss. 9 Virtual Journal for Biomedical Optics

Citation
Zhenmei Li, Jin Shen, Wei Liu, and Yajing Wang, "Research on ultrafine particle size measurement using small amounts of data," Appl. Opt. 50, 4855-4859 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-24-4855

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