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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 27 — Sep. 20, 2011
  • pp: 5329–5337

Diffusion dynamics of small molecules from mesoporous silicon films by real-time optical interferometry

Jeremy W. Mares and Sharon M. Weiss  »View Author Affiliations

Applied Optics, Vol. 50, Issue 27, pp. 5329-5337 (2011)

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Time-dependent laser reflectometry measurements are presented as a means to rigorously characterize analyte diffusion dynamics of small molecules from mesoporous silicon (PSi) films for drug delivery and membrane physics applications. Calculations based on inclusion of a spatially and temporally dependent solute concentration profile in a one-dimensional Fickian diffusion flow model are performed to determine the diffusion coefficients for the selected prototypical polar species, sucrose (340 Da), exiting from PSi films. The diffusion properties of the molecules depend on both PSi pore size and film thickness. For films with average pore diameters between 10 30 nm and film thicknesses between 300 900 nm , the sucrose diffusion coefficient can be tuned between approximately 100 and 550 μm 2 / s . Extensions of the real-time measurement and modeling approach for determining the diffusivity of small molecules that strongly interact with and corrode the internal surfaces of PSi films are also discussed.

© 2011 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5700) Instrumentation, measurement, and metrology : Reflection
(160.0160) Materials : Materials
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 2, 2011
Manuscript Accepted: August 3, 2011
Published: September 16, 2011

Jeremy W. Mares and Sharon M. Weiss, "Diffusion dynamics of small molecules from mesoporous silicon films by real-time optical interferometry," Appl. Opt. 50, 5329-5337 (2011)

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