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Diffusion dynamics of small molecules from mesoporous silicon films by real-time optical interferometry |
Applied Optics, Vol. 50, Issue 27, pp. 5329-5337 (2011)
http://dx.doi.org/10.1364/AO.50.005329
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Abstract
Time-dependent laser reflectometry measurements are presented as a means to rigorously characterize analyte diffusion dynamics of small molecules from mesoporous silicon (PSi) films for drug delivery and membrane physics applications. Calculations based on inclusion of a spatially and temporally dependent solute concentration profile in a one-dimensional Fickian diffusion flow model are performed to determine the diffusion coefficients for the selected prototypical polar species, sucrose (340 Da), exiting from PSi films. The diffusion properties of the molecules depend on both PSi pore size and film thickness. For films with average pore diameters between
© 2011 Optical Society of America
OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5700) Instrumentation, measurement, and metrology : Reflection
(160.0160) Materials : Materials
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties
(310.6628) Thin films : Subwavelength structures, nanostructures
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: June 2, 2011
Manuscript Accepted: August 3, 2011
Published: September 16, 2011
Citation
Jeremy W. Mares and Sharon M. Weiss, "Diffusion dynamics of small molecules from mesoporous silicon films by real-time optical interferometry," Appl. Opt. 50, 5329-5337 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-27-5329
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