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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 27 — Sep. 20, 2011
  • pp: 5351–5356

Field-of-view analysis of a polarization interference Fourier transform imaging spectrometer

Edward DeHoog, Xiaowei Xia, Alexander Parfenov, and Min-Yi Shih  »View Author Affiliations


Applied Optics, Vol. 50, Issue 27, pp. 5351-5356 (2011)
http://dx.doi.org/10.1364/AO.50.005351


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Abstract

The Fourier transform imaging spectrometer (FTIS) is an important tool for the measurement of spectral information in a scene. Advances in electro-optic crystal systems have led to the advent of the FTIS based on polarization interference filters. The operation of these devices as spectrometers has been well characterized, but the imaging capabilities have yet to be thoroughly explored. We explore the field-of-view limitations that occur when using this particular type of FTIS.

© 2011 Optical Society of America

OCIS Codes
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: May 3, 2011
Manuscript Accepted: July 11, 2011
Published: September 19, 2011

Citation
Edward DeHoog, Xiaowei Xia, Alexander Parfenov, and Min-Yi Shih, "Field-of-view analysis of a polarization interference Fourier transform imaging spectrometer," Appl. Opt. 50, 5351-5356 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-27-5351

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