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Field-of-view analysis of a polarization interference Fourier transform imaging spectrometer |
Applied Optics, Vol. 50, Issue 27, pp. 5351-5356 (2011)
http://dx.doi.org/10.1364/AO.50.005351
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Abstract
The Fourier transform imaging spectrometer (FTIS) is an important tool for the measurement of spectral information in a scene. Advances in electro-optic crystal systems have led to the advent of the FTIS based on polarization interference filters. The operation of these devices as spectrometers has been well characterized, but the imaging capabilities have yet to be thoroughly explored. We explore the field-of-view limitations that occur when using this particular type of FTIS.
© 2011 Optical Society of America
OCIS Codes
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: May 3, 2011
Manuscript Accepted: July 11, 2011
Published: September 19, 2011
Citation
Edward DeHoog, Xiaowei Xia, Alexander Parfenov, and Min-Yi Shih, "Field-of-view analysis of a polarization interference Fourier transform imaging spectrometer," Appl. Opt. 50, 5351-5356 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-27-5351
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