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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 28 — Oct. 1, 2011
  • pp: 5382–5389

Calibration method using a single retarder to simultaneously measure polarization and fully characterize a polarimeter over a broad range of wavelengths

Matthew J. Romerein, Jeffrey N. Philippson, Robert L. Brooks, and Ralph C. Shiell  »View Author Affiliations

Applied Optics, Vol. 50, Issue 28, pp. 5382-5389 (2011)

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A method has been developed to improve the accuracy with which the polarization state of light can be characterized by the rotating quarter-wave plate technique. Through detailed analysis, verified by experiment, we determine the positions of the optic axes of the retarder and linear polarizer, and the wave plate retardance, to better than 1 ° for typical signal-to-noise ratios. Accurate determination of the Stokes parameters can be achieved using a single wave plate for a wide range of optical wavelengths using this technique to determine the precise retardance at each of the wavelengths of interest.

© 2011 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5410) Instrumentation, measurement, and metrology : Polarimetry

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 9, 2011
Manuscript Accepted: July 27, 2011
Published: September 21, 2011

Matthew J. Romerein, Jeffrey N. Philippson, Robert L. Brooks, and Ralph C. Shiell, "Calibration method using a single retarder to simultaneously measure polarization and fully characterize a polarimeter over a broad range of wavelengths," Appl. Opt. 50, 5382-5389 (2011)

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