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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 28 — Oct. 1, 2011
  • pp: 5484–5498

Method of excess fractions with application to absolute distance metrology: theoretical analysis

Konstantinos Falaggis, David P. Towers, and Catherine E. Towers  »View Author Affiliations

Applied Optics, Vol. 50, Issue 28, pp. 5484-5498 (2011)

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The method of excess fractions (EF) is well established to resolve the fringe order ambiguity generated in interferometric detection. Despite this background, multiwavelength interferometric absolute long distance measurements have only been reported with varying degrees of success. In this paper we present a theoretical model that can predict the unambiguous measurement range in EF based on the selected measurement wavelengths and phase noise. It is shown that beat wavelength solutions are a subset of this theoretical model. The performance of EF, for a given phase noise, is shown to be equivalent to beat techniques but offers many alternative sets of measurement wavelengths and therefore EF offer significantly greater flexibility in experimental design.

© 2011 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(100.2650) Image processing : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing

ToC Category:
Image Processing

Original Manuscript: May 23, 2011
Revised Manuscript: July 23, 2011
Manuscript Accepted: July 25, 2011
Published: September 30, 2011

Konstantinos Falaggis, David P. Towers, and Catherine E. Towers, "Method of excess fractions with application to absolute distance metrology: theoretical analysis," Appl. Opt. 50, 5484-5498 (2011)

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