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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 3 — Jan. 20, 2011
  • pp: 261–266

Compact sensor for measuring two-dimensional tilt using a two-dimensional transmission grating and the Talbot effect

Koichi Iwata, Kazuo Satoh, and Kousuke Moriwaki  »View Author Affiliations

Applied Optics, Vol. 50, Issue 3, pp. 261-266 (2011)

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This paper proposes a tilt sensor that measures the small two-dimensional tilt of a plane reflective object using the Talbot effect. It is an extension of a previously proposed one-dimensional tilt sensor. The light beam reflected from the object impinges on a hexagonal grating, and the intensity of the diffracted wave is detected on an image sensor located at a Talbot distance from the grating. The diffraction intensity displaces due to the tilt of the object. The displacement is calculated by the Fourier transform method to obtain the two-dimensional tilt. This sensor is very simple and compact. The principle of the sensor is explained for a grating with a general pattern. An experiment using a hexagonal grating shows its validity. Discussions are given for making it more practical.

© 2011 Optical Society of America

OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(070.6110) Fourier optics and signal processing : Spatial filtering
(110.6760) Imaging systems : Talbot and self-imaging effects
(120.4640) Instrumentation, measurement, and metrology : Optical instruments

ToC Category:
Diffraction and Gratings

Original Manuscript: August 24, 2010
Revised Manuscript: November 10, 2010
Manuscript Accepted: November 27, 2010
Published: January 13, 2011

Koichi Iwata, Kazuo Satoh, and Kousuke Moriwaki, "Compact sensor for measuring two-dimensional tilt using a two-dimensional transmission grating and the Talbot effect," Appl. Opt. 50, 261-266 (2011)

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