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Parameter discretization in two-dimensional continuous wavelet transform for fast fringe pattern analysis |
Applied Optics, Vol. 50, Issue 34, pp. 6399-6408 (2011)
http://dx.doi.org/10.1364/AO.50.006399
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Abstract
The two-dimensional continuous wavelet transform (2D-CWT) technique provides robust processing for digital fringe pattern analysis. To cope with the problem of long computation time, a concept called the cover map is introduced to speed up the 2D-CWT analysis. The cover map is constructed by discretizing the continuous dilation and rotation parameters. The discretized parameters help substantially reduce the processing time without affecting the analysis accuracy. The theories are presented and the validity and effectiveness of the proposed concept are demonstrated by computer simulation and real experiment.
© 2011 Optical Society of America
OCIS Codes
(100.2650) Image processing : Fringe analysis
(100.5070) Image processing : Phase retrieval
(100.7410) Image processing : Wavelets
ToC Category:
Image Processing
History
Original Manuscript: June 1, 2011
Revised Manuscript: July 18, 2011
Manuscript Accepted: September 16, 2011
Published: November 25, 2011
Citation
Jun Ma, Zhaoyang Wang, Minh Vo, and Long Luu, "Parameter discretization in two-dimensional continuous wavelet transform for fast fringe pattern analysis," Appl. Opt. 50, 6399-6408 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-34-6399
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