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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 36 — Dec. 20, 2011
  • pp: 6606–6616

Polarization invariants and retrieval of surface parameters using polarization measurements in remote sensing applications

Yuri K. Shestopaloff  »View Author Affiliations

Applied Optics, Vol. 50, Issue 36, pp. 6606-6616 (2011)

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Using polarization measurements in remote sensing and optical studies allows for the retrieval of more information. We consider the relationship between the reflection coefficients of plane and rough surfaces for linearly polarized waves. Certain polarization properties of reflected waves and polarization invariants, in particular at the incident angle of 45 ° , allow finding amplitude and phase characteristics of the reflected waves. Based on this study, we introduce methods for finding dielectric permittivity, temperature, and geometric characteristics of the observed surfaces. Experimental results prove that these methods can be used for different practical purposes in technological and remote sensing applications, in a broad range of the electromagnetic spectrum.

© 2011 Optical Society of America

OCIS Codes
(240.0240) Optics at surfaces : Optics at surfaces
(280.4991) Remote sensing and sensors : Passive remote sensing
(290.5855) Scattering : Scattering, polarization
(280.6780) Remote sensing and sensors : Temperature

ToC Category:
Optics at Surfaces

Original Manuscript: June 20, 2011
Revised Manuscript: August 23, 2011
Manuscript Accepted: September 22, 2011
Published: December 15, 2011

Yuri K. Shestopaloff, "Polarization invariants and retrieval of surface parameters using polarization measurements in remote sensing applications," Appl. Opt. 50, 6606-6616 (2011)

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