|
Comparison of quarter-wave retarders over finite spectral and angular bandwidths for infrared polarimetric-imaging applications |
Applied Optics, Vol. 50, Issue 36, pp. 6682-6688 (2011)
http://dx.doi.org/10.1364/AO.50.006682
Enhanced HTML 
Acrobat PDF (676 KB)
Abstract
We compare three technological approaches for quarter-wave retarders within the context of polarimetric-imaging applications in the long-wave infrared (LWIR) spectrum. Performance of a commercial cadmium sulfide (CdS) crystalline waveplate, a multilayer meanderline structure, and a silicon (Si) form-birefringent retarder are evaluated under conditions of 8–12 μm broadband radiation emerging from an
© 2011 Optical Society of America
OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.7000) Instrumentation, measurement, and metrology : Transmission
(230.5440) Optical devices : Polarization-selective devices
(300.6340) Spectroscopy : Spectroscopy, infrared
(110.5405) Imaging systems : Polarimetric imaging
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: July 7, 2011
Revised Manuscript: August 24, 2011
Manuscript Accepted: September 2, 2011
Published: December 19, 2011
Citation
Samuel L. Wadsworth and Glenn D. Boreman, "Comparison of quarter-wave retarders over finite spectral and angular bandwidths for infrared polarimetric-imaging applications," Appl. Opt. 50, 6682-6688 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-36-6682
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Improvement of sensitivity in the analysis of vibrational properties of thin films by use of in situ ellipsometry:applications to hydrogenated amorphous carbon films (JOSAB)
- Optical Properties of a Slightly Absorbing Film for Oblique Incidence (AO)
- Soft-X-Ray Polarimeter with Multilayer Optics: Complete Analysis of the Polarization State of Light (AO)
- Depolarization and retardation of a birefringent slab (JOSAA)
- Symmetrically Coated Pellicle Beam Splitters for Dual Quarter-Wave Retardation in Reflection and Transmission (AO)
Related Conference Papers
« Previous Article | Next Article »
OSA is a member of 