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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 4 — Feb. 1, 2011
  • pp: 532–541

Integrated three-dimensional shape and reflection properties measurement system

Jakub Krzesłowski, Robert Sitnik, and Grzegorz Mączkowski  »View Author Affiliations


Applied Optics, Vol. 50, Issue 4, pp. 532-541 (2011)
http://dx.doi.org/10.1364/AO.50.000532


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Abstract

Creating accurate three-dimensional (3D) digitalized models of cultural heritage objects requires that information about surface geometry be integrated with measurements of other material properties like color and reflectance. Up until now, these measurements have been performed in laboratories using manually integrated (subjective) data analyses. We describe an out-of-laboratory bidirectional reflectance distribution function (BRDF) and 3D shape measurement system that implements shape and BRDF measurement in a single setup with BRDF uncertainty evaluation. The setup aligns spatial data with the angular reflectance distribution, yielding a better estimation of the surface’s reflective properties by integrating these two modality measurements into one setup using a single detector. This approach provides a better picture of an object’s intrinsic material features, which in turn produces a higher-quality digitalized model reconstruction. Furthermore, this system simplifies the data processing by combining structured light projection and photometric stereo. The results of our method of data analysis describe the diffusive and specular attributes corresponding to every measured geometric point and can be used to render intricate 3D models in an arbitrarily illuminated scene.

© 2011 Optical Society of America

OCIS Codes
(100.6890) Image processing : Three-dimensional image processing
(120.5240) Instrumentation, measurement, and metrology : Photometry
(290.1483) Scattering : BSDF, BRDF, and BTDF
(130.6622) Integrated optics : Subsystem integration and techniques

ToC Category:
Image Processing

History
Original Manuscript: June 23, 2010
Revised Manuscript: November 18, 2010
Manuscript Accepted: November 30, 2010
Published: January 27, 2011

Citation
Jakub Krzesłowski, Robert Sitnik, and Grzegorz Mączkowski, "Integrated three-dimensional shape and reflection properties measurement system," Appl. Opt. 50, 532-541 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-4-532


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