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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 5 — Feb. 10, 2011
  • pp: 696–700

Enhanced photoluminescence spectroscopy for thin films using the attenuated total reflection method

Takashi Wakamatsu, Tadaaki Kitami, Tomoaki Maruyama, and Susumu Toyoshima  »View Author Affiliations


Applied Optics, Vol. 50, Issue 5, pp. 696-700 (2011)
http://dx.doi.org/10.1364/AO.50.000696


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Abstract

We present a powerful spectral photoluminescence measurement method for thin films that utilizes the enhanced absorption of the fluorescent thin films on metal thin films with attenuated total reflection (ATR). The photoluminescence measurement has the advantageous effects of avoiding transmitted light and preventing the loss of luminescence through waveguiding in the film substrates. The ATR modes excited by low-power incident light provide fluorescence intensities that are considerably larger than that of conventional photoluminescence measurements and preserve the spectral profile of the photoluminescence.

© 2011 Optical Society of America

OCIS Codes
(160.2540) Materials : Fluorescent and luminescent materials
(260.6970) Physical optics : Total internal reflection
(300.2530) Spectroscopy : Fluorescence, laser-induced
(300.6280) Spectroscopy : Spectroscopy, fluorescence and luminescence
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Materials

History
Original Manuscript: October 26, 2010
Revised Manuscript: December 19, 2010
Manuscript Accepted: December 30, 2010
Published: February 7, 2011

Citation
Takashi Wakamatsu, Tadaaki Kitami, Tomoaki Maruyama, and Susumu Toyoshima, "Enhanced photoluminescence spectroscopy for thin films using the attenuated total reflection method," Appl. Opt. 50, 696-700 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-5-696

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