OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 5 — Feb. 10, 2011
  • pp: 755–765

Achromatic athermalized retarder fabrication

Anna-Britt Mahler, Stephen McClain, and Russell Chipman  »View Author Affiliations


Applied Optics, Vol. 50, Issue 5, pp. 755-765 (2011)
http://dx.doi.org/10.1364/AO.50.000755


View Full Text Article

Enhanced HTML    Acrobat PDF (1014 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A method for fabricating an achromatic, athermalized quarter-wave retarder is presented that involves monitoring retardance during polishing. A design specified by thicknesses alone is unlikely to meet specification due to uncertainties in birefringence. This method facilitates successful fabrication to a retardance specification despite these uncertainties. A retarder made from sapphire, MgF 2 , and quartz was designed, fabricated, and its performance validated for the 0.470 to 0.865 μm wavelength region. Its specifications are as follows: at wavebands centered at 0.470, 0.660, and 0.865 μm , the band-averaged retardance should be 90 ° ± 10 ° for all fields and retardance should change less than 0.1 ° for a 1 ° change in temperature. Retarder fabrication accommodated birefringence and thickness uncertainties via the following steps. The first plate was polished to a target thickness. The retardance spectrum of the first plate was then measured and used to determine a retardance target for the second plate. The retardance spectrum of the combined first and second plates was then used to specify a retardance target for the third plate. The retardance spectrum of the three plates in combination was then used to determine when the final thickness of the third plate was reached.

© 2011 Optical Society of America

OCIS Codes
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.4610) Instrumentation, measurement, and metrology : Optical fabrication

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: August 12, 2010
Revised Manuscript: November 9, 2010
Manuscript Accepted: November 16, 2010
Published: February 9, 2011

Citation
Anna-Britt Mahler, Stephen McClain, and Russell Chipman, "Achromatic athermalized retarder fabrication," Appl. Opt. 50, 755-765 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-5-755

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited