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Gap thickness retrieval on air etalon by using a focused incoherent white-light beam |
Applied Optics, Vol. 50, Issue 7, pp. 1007-1013 (2011)
http://dx.doi.org/10.1364/AO.50.001007
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Abstract
In a transmittance spectrum of air etalon composed of ITO-coated glass plates, stronger spectral modulation is observed by using a focused white-light incident beam compared with that by using a conventionally collimated beam. The light source is a single commercial light-emitting diode. An angular integrated multiple-beam Fabry–Perot model is proposed that is well fitted to the measured transmittance spectra. The gap thickness of the air etalon is sensitively retrieved and mapped at a lateral surface resolution of about
© 2011 Optical Society of America
OCIS Codes
(230.3720) Optical devices : Liquid-crystal devices
(260.3160) Physical optics : Interference
(310.6188) Thin films : Spectral properties
ToC Category:
Thin Films
History
Original Manuscript: October 12, 2010
Revised Manuscript: November 15, 2010
Manuscript Accepted: January 7, 2011
Published: February 24, 2011
Citation
Bin Gao, Haihui Pu, Hongyue Gao, Dejin Yin, and Jianhua Liu, "Gap thickness retrieval on air etalon by using a focused incoherent white-light beam," Appl. Opt. 50, 1007-1013 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-7-1007
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