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Mechanical stress measurement by an achromatic optical digital speckle pattern interferometry strain sensor with radial in-plane sensitivity: experimental comparison with electrical strain gauges |
Applied Optics, Vol. 50, Issue 7, pp. 1014-1022 (2011)
http://dx.doi.org/10.1364/AO.50.001014
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Abstract
This paper shows the optical setup of a radial in-plane digital speckle pattern interferometer which uses an axis-symmetrical diffractive optical element (DOE) to obtain double illumination. The application of the DOE gives in-plane sensitivity which only depends on the grating period of the DOE instead of the wavelength of the laser used as illumination source. A compact optical layout was built in order to have a portable optical strain sensor with a circular measurement area of about
© 2011 Optical Society of America
OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(090.1995) Holography : Digital holography
(120.6165) Instrumentation, measurement, and metrology : Speckle interferometry, metrology
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: November 23, 2010
Manuscript Accepted: January 4, 2011
Published: February 24, 2011
Citation
Matias R. Viotti, Armando Albertazzi G., Jr., and Walter A. Kapp, "Mechanical stress measurement by an achromatic optical digital speckle pattern interferometry strain sensor with radial in-plane sensitivity: experimental comparison with electrical strain gauges," Appl. Opt. 50, 1014-1022 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-7-1014
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