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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 9 — Mar. 20, 2011
  • pp: C129–C134

Optical properties of dielectric thin films including quantum dots

François Flory, Yu-Jen Chen, Cheng-Chung Lee, Ludovic Escoubas, Jean-Jacques Simon, Philippe Torchio, Judikaël Le Rouzo, Sylvain Vedraine, Hassina Derbal-Habak, Ivan Shupyk, Yahia Didane, and Jörg Ackermann  »View Author Affiliations

Applied Optics, Vol. 50, Issue 9, pp. C129-C134 (2011)

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Depending on the minimum size of their micro/nanostructure, thin films can exhibit very different behaviors and optical properties. From optical waveguides down to artificial anisotropy, through diffractive optics and photonic crystals, the application changes when decreasing the minimum feature size. Rigorous electromagnetic theory can be used to model most of the components, but, when the size is a few nanometers, quantum theory also has to be used. The materials, including quantum structures, are of particular interest for many applications, in particular for solar cells because of their luminescent and electronic properties. We show that the properties of electrons in periodic and nonperiodic multiple quantum well structures can be easily modeled with a formalism similar to that used for multilayer waveguides. The effects of different parameters, in particular the coupling between wells and well thickness dispersion, on possible discrete energy levels or the energy band of electrons and on electron wave functions are given. When such quantum confinement appears, the spectral absorption and extinction coefficient dispersion with wavelength are modified. The dispersion of the real part of the refractive index can be deduced from the Kramers–Kronig relations. Associated with homogenization theory, this approach gives a new model of the refractive index for thin films including quantum dots. The bandgap of ZnO quantum dots in solution obtained from the absorption spectrum is in good agreement with our calculation.

© 2011 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties
(160.4236) Materials : Nanomaterials
(250.5590) Optoelectronics : Quantum-well, -wire and -dot devices

Original Manuscript: July 30, 2010
Revised Manuscript: October 13, 2010
Manuscript Accepted: October 15, 2010
Published: November 18, 2010

François Flory, Yu-Jen Chen, Cheng-Chung Lee, Ludovic Escoubas, Jean-Jacques Simon, Philippe Torchio, Judikaël Le Rouzo, Sylvain Vedraine, Hassina Derbal-Habak, Ivan Shupyk, Yahia Didane, and Jörg Ackermann, "Optical properties of dielectric thin films including quantum dots," Appl. Opt. 50, C129-C134 (2011)

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