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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 9 — Mar. 20, 2011
  • pp: C172–C177

Optical Interference Coatings 2010 Measurement Problem

Angela Duparré and Detlev Ristau  »View Author Affiliations


Applied Optics, Vol. 50, Issue 9, pp. C172-C177 (2011)
http://dx.doi.org/10.1364/AO.50.00C172


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Abstract

The 2010 Measurement Problem comprised the determination of the reflectance of high-reflective dielectric mirrors at 1064 nm .

© 2011 Optical Society of America

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(310.6860) Thin films : Thin films, optical properties

History
Original Manuscript: August 6, 2010
Manuscript Accepted: September 22, 2010
Published: December 3, 2010

Citation
Angela Duparré and Detlev Ristau, "Optical Interference Coatings 2010 Measurement Problem," Appl. Opt. 50, C172-C177 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-9-C172

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