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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 9 — Mar. 20, 2011
  • pp: C172–C177

Optical Interference Coatings 2010 Measurement Problem

Angela Duparré and Detlev Ristau  »View Author Affiliations

Applied Optics, Vol. 50, Issue 9, pp. C172-C177 (2011)

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The 2010 Measurement Problem comprised the determination of the reflectance of high-reflective dielectric mirrors at 1064 nm .

© 2011 Optical Society of America

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(310.6860) Thin films : Thin films, optical properties

Original Manuscript: August 6, 2010
Manuscript Accepted: September 22, 2010
Published: December 3, 2010

Angela Duparré and Detlev Ristau, "Optical Interference Coatings 2010 Measurement Problem," Appl. Opt. 50, C172-C177 (2011)

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  1. A. Duparré and D. Ristau, “2004 Topical Meeting on Optical Interference Coatings: Measurement Problem,” in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WD1.
  2. A. Duparré and D. Ristau, “Optical Interference Coatings 2007 Measurement Problem,” Appl. Opt. 47, C179–C184 (2008). [CrossRef] [PubMed]
  3. S. Schröder, T. Herffurth, H. Blaschke, and A. Duparré, “Angle resolved scattering: an effective method for characterizing thin film coatings,” Appl. Opt. 50, C164–C171 (2011).
  4. A. Duparré, J. Ferre-Borull, S. Gliech, G. Notni, J. Steinert, and J. M. Bennett, “Surface characterization techniques for determining the rms roughness and power spectral densities of optical components,” Appl. Opt. 41, 154–171(2002). [CrossRef] [PubMed]
  5. “Optics and optical instruments—test methods for radiation scattered by optical components,” ISO 13696:2002 (International Organization for Standardization, 2002).

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