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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 9 — Mar. 20, 2011
  • pp: C217–C221

Instantaneous spatially resolved acquisition of polarimetric and angular scattering properties in optical coatings

Myriam Zerrad and Michel Lequime  »View Author Affiliations

Applied Optics, Vol. 50, Issue 9, pp. C217-C221 (2011)

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A CCD angular resolved scattering setup is presented. This new high sensitivity instrument allows both spatial and angular resolved measurement of scattered field intensity and polarimetric features. Applications to the comprehensive characterization of optical coatings are given.

© 2011 Optical Society of America

OCIS Codes
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

Original Manuscript: July 30, 2010
Revised Manuscript: November 5, 2010
Manuscript Accepted: November 5, 2010
Published: December 15, 2010

Myriam Zerrad and Michel Lequime, "Instantaneous spatially resolved acquisition of polarimetric and angular scattering properties in optical coatings," Appl. Opt. 50, C217-C221 (2011)

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