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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 9 — Mar. 20, 2011
  • pp: C239–C245

Group delay dispersion measurement of a dispersive mirror by spectral interferometry: comparison of different signal processing algorithms

Zhenyue Luo, Shuna Zhang, Wei-dong Shen, Cen Xia, Qun Ma, Xu Liu, and Yueguang Zhang  »View Author Affiliations


Applied Optics, Vol. 50, Issue 9, pp. C239-C245 (2011)
http://dx.doi.org/10.1364/AO.50.00C239


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Abstract

We built a dispersive white-light spectral interferometer for precisely measuring the dispersion properties of a multilayer thin-film structure. A novel algorithm with improved robustness to measurement errors is presented by combining a windowed Fourier transformation with wavelet-based differentiation. Compared with previously published algorithms, this method shows substantial resistance to measurement errors. The group delay dispersion properties of bulk materials and a homemade chirped mirror are measured by our apparatus, and the measurement result manifests considerable accuracy and ro bustness. The technique shows reasonable potential for the characterization of ultrabroadband chirped mirrors.

© 2011 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(310.6860) Thin films : Thin films, optical properties
(320.7100) Ultrafast optics : Ultrafast measurements
(230.2035) Optical devices : Dispersion compensation devices

History
Original Manuscript: July 30, 2010
Revised Manuscript: October 23, 2010
Manuscript Accepted: October 29, 2010
Published: December 28, 2010

Citation
Zhenyue Luo, Shuna Zhang, Wei-dong Shen, Cen Xia, Qun Ma, Xu Liu, and Yueguang Zhang, "Group delay dispersion measurement of a dispersive mirror by spectral interferometry: comparison of different signal processing algorithms," Appl. Opt. 50, C239-C245 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-9-C239


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References

  1. V. Pervak, I. Ahmad, M. K. Trubetskov, A. V. Tikhonravov, and F. Krausz, “Double-angle multilayer mirrors with smooth dispersion characteristics,” Opt. Express 17, 7943–7951 (2009). [CrossRef] [PubMed]
  2. B. Golubovic, R. R. Austin, M. K. Steiner-Shepard, M. K. Reed, S. A. Diddams, D. J. Jones, and A. G. Van Engen, “Double Gires—Tournois interferometer negative-dispersion mirrors for use in tunable mode-locked lasers,” Opt. Lett. 25, 275–277(2000). [CrossRef]
  3. P. Hlubina, D. Ciprian, J. Lunácek, and M. Lesnák, “Dispersive white-light spectral interferometry with absolute phase retrieval to measure thin film,” Opt. Express 14, 7678–7685(2006). [CrossRef] [PubMed]
  4. Z. Luo, X. Liu, and S. Zhang, “Dispersive white-light spectral interferometer for optical properties measurement of optical thin film,” Chin. Opt. Lett. 8 supplement, 94–99(2010). [CrossRef]
  5. A. Gosteva, M. Haiml, R. Paschotta, and U. Keller, “Noise-related resolution limit of dispersion measurements with white-light interferometers,” J. Opt. Soc. Am. B 22, 1868–1874(2005). [CrossRef]
  6. T. V. Amotchkina, A. V. Tikhonravov, M. K. Trubetskov, D. Grupe, A. Apolonski, and V. Pervak, “Measurement of group delay of dispersive mirrors with white-light interferometer,” Appl. Opt. 48, 949–956 (2009). [CrossRef] [PubMed]
  7. Y. Deng, W. Yang, C. Zhou, X. Wang, J. Tao, W. Kong, and Z. Zhang, “Wavelet-transform analysis for group delay extraction of white light spectral interferograms,” Opt. Express 17, 6038–6043 (2009). [CrossRef] [PubMed]
  8. Z. Luo, S. Zhang, W. Shen, and X. Liu, “Direct measurement of group-delay properties for dispersive mirrors,” in Optical Interference Coatings, OSA Technical Digest (Optical Society of America, 2010), paper FB4.
  9. P. Hlubina, J. Lunacek, D. Ciprian, and R. Chlebus, “Windowed Fourier transform applied in the wavelength domain to process the spectral interference signals,” Opt. Commun. 281, 2349–2354 (2008). [CrossRef]
  10. H. Lei, K. Qian, P. Bing, and A. Asundia, “Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry,” Opt. Lasers Eng. 48, 141–148 (2010). [CrossRef]
  11. J. Zhong and H. Zeng, “Multiscale windowed Fourier transform for phase extraction of fringe patterns,” Appl. Opt. 46, 2670–2675 (2007). [CrossRef] [PubMed]
  12. K. Alexander, F. Chau, and J. Gao, “Wavelet transform: a method for derivative calculation in analytical chemistry,” Anal. Chem. 70, 5222–5229 (1998). [CrossRef]
  13. J. Luo, J. Bai, and J. Shao, “Application of the wavelet transforms on axial strain calculation in ultrasound elastography,” Prog. Nat. Sci. 16, 942–947 (2006). [CrossRef]
  14. D. Reolon, M. Jacquot, I. Verrier, G. Brun, and C. Veillas, “High resolution group refractive index measurement by broadband supercontinuum interferometry and wavelet-transform analysis,” Opt. Express 14, 12744–12750 (2006). [CrossRef] [PubMed]

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