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Group delay dispersion measurement of a dispersive mirror by spectral interferometry: comparison of different signal processing algorithms |
Applied Optics, Vol. 50, Issue 9, pp. C239-C245 (2011)
http://dx.doi.org/10.1364/AO.50.00C239
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Abstract
We built a dispersive white-light spectral interferometer for precisely measuring the dispersion properties of a multilayer thin-film structure. A novel algorithm with improved robustness to measurement errors is presented by combining a windowed Fourier transformation with wavelet-based differentiation. Compared with previously published algorithms, this method shows substantial resistance to measurement errors. The group delay dispersion properties of bulk materials and a homemade chirped mirror are measured by our apparatus, and the measurement result manifests considerable accuracy and ro bustness. The technique shows reasonable potential for the characterization of ultrabroadband chirped mirrors.
© 2011 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(310.6860) Thin films : Thin films, optical properties
(320.7100) Ultrafast optics : Ultrafast measurements
(230.2035) Optical devices : Dispersion compensation devices
History
Original Manuscript: July 30, 2010
Revised Manuscript: October 23, 2010
Manuscript Accepted: October 29, 2010
Published: December 28, 2010
Citation
Zhenyue Luo, Shuna Zhang, Wei-dong Shen, Cen Xia, Qun Ma, Xu Liu, and Yueguang Zhang, "Group delay dispersion measurement of a dispersive mirror by spectral interferometry: comparison of different signal processing algorithms," Appl. Opt. 50, C239-C245 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-9-C239
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