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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 9 — Mar. 20, 2011
  • pp: C364–C367

Use of gold island films in design of reflectors with high luminosity

Hrvoje Zorc, Martin Lončarić, and Jordi Sancho-Parramon  »View Author Affiliations

Applied Optics, Vol. 50, Issue 9, pp. C364-C367 (2011)

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We describe the optical properties of gold island films embedded between SiO 2 and/or TiO 2 layers. Plasmonic properties of gold films have been characterized using spectrometry and variable angle spectroscopic ellipsometry for various combinations of the embedding media. The obtained refractive indices of embedded gold island films have been used in the design of several types of multilayer reflectors.

© 2011 Optical Society of America

OCIS Codes
(240.6680) Optics at surfaces : Surface plasmons
(310.1620) Thin films : Interference coatings
(310.4165) Thin films : Multilayer design
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

Original Manuscript: July 21, 2010
Revised Manuscript: December 28, 2010
Manuscript Accepted: December 28, 2010
Published: February 2, 2011

Hrvoje Zorc, Martin Lončarić, and Jordi Sancho-Parramon, "Use of gold island films in design of reflectors with high luminosity," Appl. Opt. 50, C364-C367 (2011)

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  1. U. Kreibig and M. Vollmer, Optical Properties of Metal Clusters, Springer Series in Material Science (Springer, 1995), Vol.  25.
  2. H. Zorc, M. Lončarić, J. Sancho, and V. Janicki, “Optical properties of plasmonic nanomaterials in thin film,” presented at the 6th Scientific Meeting of the Croatian Physical Society, Primošten, Croatia, 8–11 Oct 2009.
  3. M. Lončarić, J. Sancho-Parramon, M. Pavlović, H. Zorc, P. Dubček, A. Turković, S. Bernstorff, G. Jakopic, and A. Haase, “Optical and structural characterization of silver islands films on glass substrates,” Vacuum 84, 188–192 (2009). [CrossRef]
  4. M. Lončarić, J. Sancho-Parramon, and H. Zorc, “Optical properties of gold island films—a spectroscopic ellipsometry study,” Thin Solid Films (to be published). [CrossRef]
  5. J. N. Hilfiker, N. Singh, T. Tiwald, D. Convey, S. M. Smith, J. H. Baker, and H. G. Tompkins, “Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry,” Thin Solid Films 516, 7979–7989 (2008). [CrossRef]
  6. P. Heger, O. Stenzel, and N. Kaiser, “Metal island films for optics,” Proc. SPIE 5250, 21–28 (2004). [CrossRef]

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