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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 9 — Mar. 20, 2011
  • pp: C441–C448

Estimation of phase shifts linked only to the coating for a dielectric mirror

Hervé Piombini  »View Author Affiliations


Applied Optics, Vol. 50, Issue 9, pp. C441-C448 (2011)
http://dx.doi.org/10.1364/AO.50.00C441


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Abstract

The wavefront is an important characteristic for a dielectric mirror. Its measurement is usually performed with interferometers. We introduce a new method to evaluate only the coating wavefront distortion due to nonuniform thickness errors by using a reflectometer. This method uses some reflectance or transmittance maps at a wavenumber σ m for which the reflectance or transmittance factor variation is high. These variations are translated into some central wavenumber σ c variations, which enables the determination of a phase map from experimental treatment.

© 2011 Optical Society of America

OCIS Codes
(120.1840) Instrumentation, measurement, and metrology : Densitometers, reflectometers
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5700) Instrumentation, measurement, and metrology : Reflection

History
Original Manuscript: July 30, 2010
Revised Manuscript: October 29, 2010
Manuscript Accepted: February 18, 2011
Published: March 17, 2011

Citation
Hervé Piombini, "Estimation of phase shifts linked only to the coating for a dielectric mirror," Appl. Opt. 50, C441-C448 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-9-C441

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