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Laser induced deflection technique for absolute thin film absorption measurement: optimized concepts and experimental results |
Applied Optics, Vol. 50, Issue 9, pp. C449-C456 (2011)
http://dx.doi.org/10.1364/AO.50.00C449
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Abstract
Using experimental results and numerical simulations, two measuring concepts of the laser induced deflection (LID) technique are introduced and optimized for absolute thin film absorption measurements from deep ultraviolet to IR wavelengths. For transparent optical coatings, a particular probe beam deflection direction allows the absorption measurement with virtually no influence of the substrate absorption, yielding improved accuracy compared to the common techniques of separating bulk and coating absorption. For high-reflection coatings, where substrate absorption contributions are negligible, a different probe beam deflection is chosen to achieve a better signal-to-noise ratio. Various experimental results for the two different measurement concepts are presented.
© 2011 Optical Society of America
OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(160.4670) Materials : Optical materials
(300.1030) Spectroscopy : Absorption
(300.2530) Spectroscopy : Fluorescence, laser-induced
(310.0310) Thin films : Thin films
History
Original Manuscript: August 6, 2010
Revised Manuscript: February 4, 2011
Manuscript Accepted: February 11, 2011
Published: March 17, 2011
Citation
Christian Mühlig, Siegfried Kufert, Simon Bublitz, and Uwe Speck, "Laser induced deflection technique for absolute thin film absorption measurement: optimized concepts and experimental results," Appl. Opt. 50, C449-C456 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-9-C449
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