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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 50, Iss. 9 — Mar. 20, 2011
  • pp: C449–C456

Laser induced deflection technique for absolute thin film absorption measurement: optimized concepts and experimental results

Christian Mühlig, Siegfried Kufert, Simon Bublitz, and Uwe Speck  »View Author Affiliations


Applied Optics, Vol. 50, Issue 9, pp. C449-C456 (2011)
http://dx.doi.org/10.1364/AO.50.00C449


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Abstract

Using experimental results and numerical simulations, two measuring concepts of the laser induced deflection (LID) technique are introduced and optimized for absolute thin film absorption measurements from deep ultraviolet to IR wavelengths. For transparent optical coatings, a particular probe beam deflection direction allows the absorption measurement with virtually no influence of the substrate absorption, yielding improved accuracy compared to the common techniques of separating bulk and coating absorption. For high-reflection coatings, where substrate absorption contributions are negligible, a different probe beam deflection is chosen to achieve a better signal-to-noise ratio. Various experimental results for the two different measurement concepts are presented.

© 2011 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(160.4670) Materials : Optical materials
(300.1030) Spectroscopy : Absorption
(300.2530) Spectroscopy : Fluorescence, laser-induced
(310.0310) Thin films : Thin films

History
Original Manuscript: August 6, 2010
Revised Manuscript: February 4, 2011
Manuscript Accepted: February 11, 2011
Published: March 17, 2011

Citation
Christian Mühlig, Siegfried Kufert, Simon Bublitz, and Uwe Speck, "Laser induced deflection technique for absolute thin film absorption measurement: optimized concepts and experimental results," Appl. Opt. 50, C449-C456 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-9-C449


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References

  1. L. Gallais and M. Commandré, “Simultaneous absorption, scattering, and luminescence mappings for the characterization of optical coatings and surfaces,” Appl. Opt. 45, 1416–1424 (2006). [CrossRef] [PubMed]
  2. J. Cifre and J. P. Roger, “Absolute infrared absorption measurements in optical coatings using mirage detection,” Thin Solid Films 320, 198–205 (1998). [CrossRef]
  3. U. Willamowski, T. Gross, D. Ristau, and H. Welling, “Calorimetric measurement of optical absorption at 532 nm and 1064 nm according to ISO/DIS 11551,” Proc. SPIE 2870, 483–494 (1996). [CrossRef]
  4. B. Li, H. Blaschke, and D. Ristau, “Combined laser calorimetry and photothermal technique for absorption measurement of optical coatings,” Appl. Opt. 45, 5827–5831(2006). [CrossRef] [PubMed]
  5. L. Jensen, I. Balasa, H. Blaschke, and D. Ristau, “Novel technique for the determination of hydroxyl dstributions in fused silica,” Opt. Express 17, 17144–17149(2009). [CrossRef] [PubMed]
  6. A. Marcano, C. Coper, and N. Melikechi, “High-sensitivity absorption measurement in water and glass samples using a mode-mismatched pump-probe thermal lens method,” Appl. Phys. Lett. 78, 3415–3417 (2001). [CrossRef]
  7. H. S. M. de Vries, N. Dam, M. R. van Lieshout, C. Sikkens, F. J. M. Harren, and J. Reuss, “A real-time, nonintrusive trace gas detector based on laser photothermal deflection,” Rev. Sci. Instrum. 66, 4655–4664 (1995). [CrossRef]
  8. M. Guntau and W. Triebel, “A novel method to measure bulk absorption in optically transparent materials,” Rev. Sci. Instrum. 71, 2279–2282 (2000). [CrossRef]
  9. C. Mühlig, W. Triebel, S. Kufert, and S. Bublitz, “Characterization of low losses in optical thin films and materials,” Appl. Opt. 47, C135–C142 (2008). [CrossRef] [PubMed]
  10. W. Triebel, C. Mühlig, and S. Kufert, “Application of the laser induced deflection (LID) technique for low absorption measurements in bulk materials and coatings,” Proc. SPIE 5965, 499–508 (2005).
  11. D. Schönfeld, U. Klett, C. Mühlig, and S. Thomas, “Measurement of initial absorption of fused silica at 193 nm using laser induced deflection technique (LID),” Proc. SPIE 6720, 67201A (2007). [CrossRef]
  12. C. Mühlig, W. Triebel, and S. Kufert, “Coefficients of stationary ArF laser pulse absorption in fused silica (type III),” J. Non-Cryst. Solids 353, 542–545 (2007). [CrossRef]

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