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Expanded viewpoint for broadband antireflection coating designs |
Applied Optics, Vol. 50, Issue 9, pp. C86-C89 (2011)
http://dx.doi.org/10.1364/AO.50.000C86
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Abstract
Examining spectral regions outside of the band where an antireflection coating is specified can aid in finding optimal design solutions. The reflectance versus wavenumber plots at low frequencies indicate the overall thickness of the design. These plots also point to whether the design will provide the minimum possible average reflectance in the specified band. It has been discovered that these patterns are nearly replicated by the plot of a quarter-wave stack at peak frequency. It is also found that optimal solutions exist only at quantized intervals.
© 2011 Optical Society of America
OCIS Codes
(310.0310) Thin films : Thin films
(310.1210) Thin films : Antireflection coatings
(310.1620) Thin films : Interference coatings
(310.4165) Thin films : Multilayer design
(310.5696) Thin films : Refinement and synthesis methods
(310.6805) Thin films : Theory and design
History
Original Manuscript: August 6, 2010
Revised Manuscript: September 22, 2010
Manuscript Accepted: September 30, 2010
Published: November 3, 2010
Citation
Ronald R. Willey, "Expanded viewpoint for broadband antireflection coating designs," Appl. Opt. 50, C86-C89 (2011)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-50-9-C86
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