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Applied Optics

Applied Optics


  • Vol. 51, Iss. 12 — Apr. 20, 2012
  • pp: 1939–1944

Sinusoidal phase-modulating interferometer insensitive to intensity modulation of a laser diode for displacement measurement

Bofan Wang, Xiangzhao Wang, Osami Sasaki, and Zhongliang Li  »View Author Affiliations

Applied Optics, Vol. 51, Issue 12, pp. 1939-1944 (2012)

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In sinusoidal phase-modulating laser diode interferometers, an injection current of a laser diode is sinusoidally modulated to scan the laser wavelength. However, the modulation of the injection current also involves an intensity modulation of the light, which increases the measurement error if a conventional signal processing is used. A novel signal processing for displacement measurement is proposed to eliminate the influence of the intensity modulation. Numerical simulation results and experimental results make it clear that an optimal depth of the sinusoidal phase modulation exists that can reduce the measurement error to a few nanometers.

© 2012 Optical Society of America

OCIS Codes
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(350.2460) Other areas of optics : Filters, interference

ToC Category:
Fourier Optics and Signal Processing

Original Manuscript: November 28, 2011
Manuscript Accepted: December 19, 2011
Published: April 11, 2012

Bofan Wang, Xiangzhao Wang, Osami Sasaki, and Zhongliang Li, "Sinusoidal phase-modulating interferometer insensitive to intensity modulation of a laser diode for displacement measurement," Appl. Opt. 51, 1939-1944 (2012)

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  1. O. Sasaki and K. Takahashi, “Sinusoidal phase modulating interferometer using optical fibers for displacement measurement,” Appl. Opt. 27, 4139–4142 (1988). [CrossRef]
  2. K. Wang, Z. Ding, Y. Zeng, J. Meng, and M. Chen, “Sinusoidal B-M method based spectral domain optical coherence tomography for the elimination of complex-conjugate artifact,” Opt. Express. 17, 16820–16833 (2009). [CrossRef]
  3. G. Heinzel, F. G. Cervantes, A. G. Marín, J. Kullmann, W. Feng, and K. Danzmann, “Deep phase modulation interferometry,” Opt. Express. 18, 19076–19086 (2010). [CrossRef]
  4. K. Falaggis, D. Towers, and C. Towers, “Phase measurement through sinusoidal excitation with application to multi-wavelength interferometry,” J. Opt. A 11, 054008(2009). [CrossRef]
  5. U. Minoni, E. Sardini, E. Gelmini, F. Docchio, and D. Marioli, “A high-frequency sinusoidal phase-modulation interferometer using an electro-optic modulator: Development and evaluation,” Rev. Sci. Instrum. 62, 2579–2583(1991). [CrossRef]
  6. T. Suzuki, M. Matsuda, O. Sasaki, and T. Maruyama, “Laserdiode interferometer with a photothermal modulation,” Appl. Opt. 38, 7069–7075 (1999). [CrossRef]
  7. X. Wang, X. Wang, F. Qian, G. Chen, G. Chen, and Z. Fang, “Photothermal modulation of laser diode wavelength: application to sinusoiadal phase-modulating interferometer for displacement measurements,” Opt. Laser Technol. 31, 559–564 (1999). [CrossRef]
  8. X. Wang, X. Wang, Y. Liu, C. Zhang, and D. Yu, “A sinusoidal phase-modulating fiber-optic interferometer insensitive to the intensity change of the light source,” Opt. Laser Technol. 35, 219–222 (2003). [CrossRef]
  9. Z. Li, X. Wang, Y. Liu, and Y. Bu, “All fiber-optic sinusoidal phase-modulating interferometer insensitive to intensity modulation of light source,” Chin. J. Lasers 34, 1267–1270 (2007).
  10. Z. Li, X. Wang, P. Bu, B. Huang, and D. Zhen, “Sinusoidal phase-modulating laser diode interferometer insensitive to the intensity modulation of light source,” Optik 120, 799–803(2009). [CrossRef]
  11. O. Sasaki, T. Suzuki, and K. Takahashi, “Sinusoidal phase modulating laser diode interferometer with a feedback control system to eliminate external disturbance,” Opt. Eng. 29, 1511–1515 (1990). [CrossRef]
  12. X. Wang, X. Wang, H. Lu, F. Qian, and Y. Bu, “Laser diode interferometer used to measure displacements within large range with a few nanometer accuracy,” Opt. Laser Techonol. 33, 219–223 (2001). [CrossRef]

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