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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 51, Iss. 12 — Apr. 20, 2012
  • pp: 2129–2134

ZrO2 thin-film-based sapphire fiber temperature sensor

Jiajun Wang, Evan M. Lally, Xiaoping Wang, Jianmin Gong, Gary Pickrell, and Anbo Wang  »View Author Affiliations


Applied Optics, Vol. 51, Issue 12, pp. 2129-2134 (2012)
http://dx.doi.org/10.1364/AO.51.002129


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Abstract

A submicrometer-thick zirconium dioxide film was deposited on the tip of a polished C-plane sapphire fiber to fabricate a temperature sensor that can work to an extended temperature range. Zirconium dioxide was selected as the thin film material to fabricate the temperature sensor because it has relatively close thermal expansion to that of sapphire, but more importantly it does not react appreciably with sapphire up to 1800 °C. In order to study the properties of the deposited thin film, ZrO2 was also deposited on C-plane sapphire substrates and characterized by x-ray diffraction for phase analysis as well as by atomic force microscopy for analysis of surface morphology. Using low-coherence optical interferometry, the fabricated thin-film-based sapphire fiber sensor was tested in the lab up to 1200 °C and calibrated from 200° to 1000 °C. The temperature resolution is determined to be 5.8 °C when using an Ocean Optics USB4000 spectrometer to detect the reflection spectra from the ZrO2 thin-film temperature sensor.

© 2012 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(120.6780) Instrumentation, measurement, and metrology : Temperature
(310.1620) Thin films : Interference coatings

ToC Category:
Fiber Optics and Optical Communications

History
Original Manuscript: January 27, 2012
Revised Manuscript: March 4, 2012
Manuscript Accepted: March 5, 2012
Published: April 18, 2012

Citation
Jiajun Wang, Evan M. Lally, Xiaoping Wang, Jianmin Gong, Gary Pickrell, and Anbo Wang, "ZrO2 thin-film-based sapphire fiber temperature sensor," Appl. Opt. 51, 2129-2134 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-12-2129

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