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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 16 — Jun. 1, 2012
  • pp: 3214–3223

Theoretical error analysis of the sampling moiré method and phase compensation methodology for single-shot phase analysis

Shien Ri and Takashi Muramatsu  »View Author Affiliations


Applied Optics, Vol. 51, Issue 16, pp. 3214-3223 (2012)
http://dx.doi.org/10.1364/AO.51.003214


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Abstract

Recently, a rapid and accurate single-shot phase measurement technique called the sampling moiré method has been developed for small-displacement distribution measurements. In this study, the theoretical phase error of the sampling moiré method caused by linear intensity interpolation in the case of a mismatch between the sampling pitch and the original grating pitch is analyzed. The periodic phase error is proportional to the square of the spatial angular frequency of the moiré fringe. Moreover, an effective phase compensation methodology is developed to reduce the periodic phase error. Single-shot phase analysis can perform accurately even when the sampling pitch is not matched to the original grating pitch exactly. The primary simulation results demonstrate the effectiveness of the proposed phase compensation methodology.

© 2012 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(100.5070) Image processing : Phase retrieval
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4120) Instrumentation, measurement, and metrology : Moire' techniques
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Image Processing

History
Original Manuscript: January 10, 2012
Revised Manuscript: March 28, 2012
Manuscript Accepted: March 28, 2012
Published: May 23, 2012

Citation
Shien Ri and Takashi Muramatsu, "Theoretical error analysis of the sampling moiré method and phase compensation methodology for single-shot phase analysis," Appl. Opt. 51, 3214-3223 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-16-3214


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