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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 16 — Jun. 1, 2012
  • pp: 3397–3402

Ionization effect on arc plasma’s optical diagnosis by the measurement of the refractive index

Yun-yun Chen, Cheng-yi Zhang, Fang Gu, Qing-hua Wang, and Zhen-hua Li  »View Author Affiliations


Applied Optics, Vol. 51, Issue 16, pp. 3397-3402 (2012)
http://dx.doi.org/10.1364/AO.51.003397


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Abstract

The effect of arc plasma ionization on its temperature diagnosis by the measurement of the refractive index is discussed. The refractive index of arc plasma in two conditions is compared: 1) only the first ionization is considered and 2) both the first and second ionizations are considered. In order to facilitate plasma temperature reconstruction, two corresponding refractive index models are deduced. For the sake of making this study universal, both the monatomic and dual-atomic molecule arc plasmas are chosen as typical examples for theoretical deduction and analysis. A condition, which can be adopted to estimate whether the second ionization should be considered in temperature reconstruction, is proposed. Finally, an argon arc plasma is chosen as an example for experiment, and the experimental results match well with the theoretical analysis. This study is crucial to arc plasma’s optical diagnosis, which is based on the measurement of the refractive index.

© 2012 Optical Society of America

OCIS Codes
(110.6960) Imaging systems : Tomography
(120.4120) Instrumentation, measurement, and metrology : Moire' techniques
(280.2490) Remote sensing and sensors : Flow diagnostics
(280.5395) Remote sensing and sensors : Plasma diagnostics

ToC Category:
Imaging Systems

History
Original Manuscript: December 6, 2011
Revised Manuscript: March 29, 2012
Manuscript Accepted: April 2, 2012
Published: May 30, 2012

Citation
Yun-yun Chen, Cheng-yi Zhang, Fang Gu, Qing-hua Wang, and Zhen-hua Li, "Ionization effect on arc plasma’s optical diagnosis by the measurement of the refractive index," Appl. Opt. 51, 3397-3402 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-16-3397

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