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Diffraction based phase compensation method for phase-only liquid crystal on silicon devices in operation |
Applied Optics, Vol. 51, Issue 17, pp. 3837-3846 (2012)
http://dx.doi.org/10.1364/AO.51.003837
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Abstract
A method to measure the optical response across the surface of a phase-only liquid crystal on silicon device using binary phase gratings is described together with a procedure to compensate its spatial optical phase variation. As a result, the residual power between zero and the minima of the first diffraction order for a binary grating can be reduced by more than 10 dB, from
© 2012 Optical Society of America
OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(090.0090) Holography : Holography
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(070.6120) Fourier optics and signal processing : Spatial light modulators
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: January 17, 2012
Manuscript Accepted: March 13, 2012
Published: June 7, 2012
Citation
Zichen Zhang, Haining Yang, Brian Robertson, Maura Redmond, Mike Pivnenko, Neil Collings, William A. Crossland, and Daping Chu, "Diffraction based phase compensation method for phase-only liquid crystal on silicon devices in operation," Appl. Opt. 51, 3837-3846 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-17-3837
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