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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 17 — Jun. 10, 2012
  • pp: 3874–3887

Automatic threshold technique for holographic particle field characterization

Dhananjay Kumar Singh and P. K. Panigrahi  »View Author Affiliations

Applied Optics, Vol. 51, Issue 17, pp. 3874-3887 (2012)

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The 3D distribution of a particle field by digital holography is obtained by 3D numerical reconstruction of a 2D hologram. The proper identification of particles from the background during numerical reconstruction influences the overall effectiveness of the technique. The selection of a suitable threshold value to segment particles from the background of reconstructed images during 3D holographic reconstruction process is a critical issue, which influences the accuracy of particle size and number density of reconstructed particles. The object particle field parameters, such as depth of sample volume and density of object particles, influence the optimal threshold value. The present study proposes a novel technique for the determination of the optimal threshold value of a reconstructed image. The effectiveness of the proposed technique is demonstrated using both simulated and experimental data. The proposed technique is robust to variation in optical properties of particle and background, depth of sample volume, and number density of object particle field. The particle diameter obtained from the proposed threshold technique is within 5% of that obtained from the particle size analyzer. There is a maximum ten times increase in reconstruction effectiveness by using the proposed automatic threshold technique in comparison with the fixed manual threshold technique.

© 2012 Optical Society of America

OCIS Codes
(090.0090) Holography : Holography
(090.1995) Holography : Digital holography

ToC Category:

Original Manuscript: October 5, 2011
Revised Manuscript: March 21, 2012
Manuscript Accepted: March 26, 2012
Published: June 8, 2012

Dhananjay Kumar Singh and P. K. Panigrahi, "Automatic threshold technique for holographic particle field characterization," Appl. Opt. 51, 3874-3887 (2012)

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