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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 18 — Jun. 20, 2012
  • pp: 4113–4119

Autocalibrating Stokes polarimeter for materials characterization

Masaya Shinki, Mario T. Ivanov, Joshua S. Post, Svein Vagle, Jay T. Cullen, and Dennis K. Hore  »View Author Affiliations


Applied Optics, Vol. 51, Issue 18, pp. 4113-4119 (2012)
http://dx.doi.org/10.1364/AO.51.004113


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Abstract

The design and construction of an ellipsometer based on a fixed-wavelength rotating-retarder Stokes polarimeter is described. Details are provided for an automated calibration scheme that provides two advantages for its operation. The first allows the phase of the lock-in amplifiers to be set based on the raw data, without a known calibration sample. The second illustrates that the relative amplitude of the acquired signals may also be calibrated in a similar manner. As an illustration, the refractive index and thickness of a glass cover slide are determined over a range of incident angles.

© 2012 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(260.5430) Physical optics : Polarization

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: February 13, 2012
Revised Manuscript: April 21, 2012
Manuscript Accepted: May 2, 2012
Published: June 15, 2012

Citation
Masaya Shinki, Mario T. Ivanov, Joshua S. Post, Svein Vagle, Jay T. Cullen, and Dennis K. Hore, "Autocalibrating Stokes polarimeter for materials characterization," Appl. Opt. 51, 4113-4119 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-18-4113


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