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Manufacture and characterization of optical coatings with incorporated copper island films |
Applied Optics, Vol. 51, Issue 19, pp. 4436-4447 (2012)
http://dx.doi.org/10.1364/AO.51.004436
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Abstract
Copper island films have been prepared by thermal evaporation in vacuum and characterized by in situ as well as ex situ spectrophotometry. The parallel investigation of the island morphology by means of transmission electron microscopy allowed us to establish a clear correlation between film structure and optical properties. The effective optical constants of the copper island films could be determined by means of a fit of their ex situ transmission and reflection spectra. The effective optical constants have been used for designing and preparing optical multilayer coatings applicable for attenuator or color filter specifications. Measured characteristics of the multilayer coatings are in very good agreement with the calculated spectra.
© 2012 Optical Society of America
OCIS Codes
(160.4670) Materials : Optical materials
(230.4170) Optical devices : Multilayers
(240.6680) Optics at surfaces : Surface plasmons
(310.3915) Thin films : Metallic, opaque, and absorbing coatings
(310.4165) Thin films : Multilayer design
(310.6628) Thin films : Subwavelength structures, nanostructures
ToC Category:
Thin Films
History
Original Manuscript: April 19, 2012
Manuscript Accepted: May 4, 2012
Published: June 27, 2012
Citation
Mario Held, Olaf Stenzel, Steffen Wilbrandt, Norbert Kaiser, and Andreas Tünnermann, "Manufacture and characterization of optical coatings with incorporated copper island films," Appl. Opt. 51, 4436-4447 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-19-4436
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