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Characterization of the phase modulation property of a free-space electro-optic modulator by interframe intensity correlation matrix |
Applied Optics, Vol. 51, Issue 19, pp. 4457-4462 (2012)
http://dx.doi.org/10.1364/AO.51.004457
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Abstract
Characterization of a phase modulator or phase shifter has always been an integral part of phase-modulating or phase-adjusting applications. We propose a simplified approach to characterize a phase modulator by investigating the performance of phase shifts from grabbed interferograms using the phase extraction method. After reviewing some phase analysis techniques, the interframe intensity correlation (IIC) matrix method is introduced to the investigation. The proposed strategy is illustrated by the measurement of a free-space electro-optic modulator (EOM). Placing the modulator in one arm of a Michelson interferometer, the global phase shifts are estimated by the IIC method from the phase-stepped interferograms. Experimental results demonstrate the tested EOM has a phase modulation response of at least
© 2012 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(230.2090) Optical devices : Electro-optical devices
(230.4110) Optical devices : Modulators
ToC Category:
Optical Devices
History
Original Manuscript: March 8, 2012
Revised Manuscript: May 16, 2012
Manuscript Accepted: May 17, 2012
Published: June 28, 2012
Citation
Huimin Yue, Lei Song, Zexiong Hu, Hongxiang Liu, Yong Liu, Yongzhi Liu, and Zengshou Peng, "Characterization of the phase modulation property of a free-space electro-optic modulator by interframe intensity correlation matrix," Appl. Opt. 51, 4457-4462 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-19-4457
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