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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 19 — Jul. 1, 2012
  • pp: 4477–4490

Optimized pulse width modulation pattern strategy for three-dimensional profilometry with projector defocusing

Chao Zuo, Qian Chen, Shijie Feng, Fangxiaoyu Feng, Guohua Gu, and Xiubao Sui  »View Author Affiliations

Applied Optics, Vol. 51, Issue 19, pp. 4477-4490 (2012)

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Three-dimensional profilometry by sinusoidal fringe projection using phase-shifting algorithms is usually distorted by the nonlinear intensity response of commercial video projectors. To overcome this problem, several methods including sinusoidal pulse width modulation (SPWM) were proposed to generate sinusoidal fringe patterns with binary ones by defocusing the project to some certain extent. However, the residual errors are usually nonnegligible for highly accurate measurement fields, especially when the defocusing level is insufficient. In this work, we propose two novel methods to further improve the defocusing technique. We find that by properly optimizing SPWM patterns according to some criteria, and combining SPWM technique with four-step phase-shifting algorithm, the dominant undesired harmonics will have no impact on the phase obtained. We also propose a new sinusoidal fringe generation technique called tripolar SPWM, which can generate ideal sinusoidal fringe patterns with a very small degree of defocusing. Simulations and experiments are presented to verify the performance of these two proposed techniques.

© 2012 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: March 21, 2012
Revised Manuscript: May 11, 2012
Manuscript Accepted: May 12, 2012
Published: June 29, 2012

Chao Zuo, Qian Chen, Shijie Feng, Fangxiaoyu Feng, Guohua Gu, and Xiubao Sui, "Optimized pulse width modulation pattern strategy for three-dimensional profilometry with projector defocusing," Appl. Opt. 51, 4477-4490 (2012)

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  1. F. Chen, G. M. Brown, and M. M. Song, “Overview of three-dimensional shape measurement using optical methods,” Opt. Eng. 39, 10–22 (2000). [CrossRef]
  2. S. S. Gorthi and P. Rastogi, “Fringe projection techniques: whither we are?,” Opt. Lasers Eng. 48, 133–140 (2010). [CrossRef]
  3. X. Y. Su and Q. C. Zhang, “Dynamic 3-D shape measurement method: a review,” Opt. Laser Eng. 48, 191–204 (2010). [CrossRef]
  4. S. Zhang, “Recent progresses on real-time 3D shape measurement using digital fringe projection techniques,” Opt. Laser Eng. 48, 149–158 (2010). [CrossRef]
  5. K. Liu, Y. C. Wang, D. L. Lau, Q. Hao, and L. G. Hassebrook, “Gamma model and its analysis for phase measuring profilometry,” J. Opt. Soc. Am. A 27, 553–562 (2010). [CrossRef]
  6. T. Hoang, B. Pan, D. Nguyen, and Z. Y. Wang, “Generic gamma correction for accuracy enhancement in fringe-projection profilometry,” Opt. Lett. 35, 1992–1994 (2010). [CrossRef]
  7. B. Pan, Q. Kemao, L. Huang, and A. Asundil, “Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry,” Opt. Lett. 34, 416–418 (2009). [CrossRef]
  8. G. A. Ayubi, J. M. Di Martino, J. R. Alonso, A. Fernandez, C. D. Perciante, and J. A. Ferrari, “Three-dimensional profiling with binary fringes using phase-shifting interferometry algorithms,” Appl. Opt. 50, 147–154 (2011). [CrossRef]
  9. S. Y. Lei and S. Zhang, “Flexible 3-D shape measurement using projector defocusing,” Opt. Lett. 34, 3080–3082 (2009). [CrossRef]
  10. P. S. S. Huang, C. P. Zhang, and F. P. Chiang, “High-speed 3-D shape measurement based on digital fringe projection,” Opt. Eng. 42, 163–168 (2003). [CrossRef]
  11. S. Zhang, and P. S. Huang, “Phase error compensation for a 3-D shape measurement system based on the phase-shifting method,” Opt. Eng. 46, 063601 (2007). [CrossRef]
  12. S. Zhang, and S. T. Yau, “Generic nonsinusoidal phase error correction for three-dimensional shape measurement using a digital video projector,” Appl. Opt. 46, 36–43 (2007). [CrossRef]
  13. G. A. Ayubi, J. M. Di Martino, J. R. Alonso, A. Fernández, J. L. Flores, and J. A. Ferrari, “Color encoding of binary fringes for gamma correction in 3-D profiling,” Opt. Lett. 37, 1325–1327 (2012). [CrossRef]
  14. X.-Y. Su, W.-S. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561–573 (1992). [CrossRef]
  15. G. A. Ayubi, J. A. Ayubi, J. M. Di Martino, and J. A. Ferrari, “Pulse-width modulation in defocused three-dimensional fringe projection,” Opt. Lett. 35, 3682–3684 (2010). [CrossRef]
  16. Y. J. Wang and S. Zhang, “Optimal pulse width modulation for sinusoidal fringe generation with projector defocusing,” Opt. Lett. 35, 4121–4123 (2010). [CrossRef]
  17. Y. Wang, and S. Zhang, “Comparison of the squared binary, sinusoidal pulse width modulation, and optimal pulse width modulation methods for three-dimensional shape measurement with projector defocusing,” Appl. Opt. 51, 861–872 (2012). [CrossRef]
  18. B. W. Williams, ed., Principles and Elements of Power Electronics (Barry W Williams, 2006).
  19. L. Ekstrand and S. Zhang, “Three-dimensional profilometry with nearly focused binary phase-shifting algorithms,” Opt. Lett. 36, 4518–4520 (2011). [CrossRef]
  20. J. H. Pan, P. S. Huang, and F. P. Chiang, “Color-encoded digital fringe projection technique for high-speed 3-D shape measurement: color coupling and imbalance compensation,” Proc. SPIE 5265, 205–212 (2004). [CrossRef]
  21. R. Hofling and E. Ahl, “ALP: Universal DMD controller for metrology and testing,” Proc. SPIE 5289, 322–329 (2004). [CrossRef]

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