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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 2 — Jan. 10, 2012
  • pp: 238–244

Full-field characterization of a twisted nematic liquid-crystal device using equivalence theorem of a unitary optical system

Chih-Jen Yu, Yao-Teng Tseng, Kuei-Chu Hsu, and Chien Chou  »View Author Affiliations


Applied Optics, Vol. 51, Issue 2, pp. 238-244 (2012)
http://dx.doi.org/10.1364/AO.51.000238


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Abstract

Based on the equivalence theorem of a unitary optical system, we proposed an analytical approach to characterize the cell parameters of a twisted nematic liquid-crystal device (TNLCD) with full-field resolution. The spatial distribution of three characteristic parameters of a TNLCD was measured by using a polarizer–sample–analyzer imaging polarimeter so that the untwisted phase retardation, cell thickness, and twisted angle of a TNLCD can be directly calculated through the explicit expressions as a function of the characteristic parameters. The measured results agree well with the given values. This method can be implemented for characterization of a TNLCD in the manufacturing process.

© 2012 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(230.3720) Optical devices : Liquid-crystal devices
(260.1440) Physical optics : Birefringence

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: July 19, 2011
Revised Manuscript: September 5, 2011
Manuscript Accepted: September 5, 2011
Published: January 9, 2012

Citation
Chih-Jen Yu, Yao-Teng Tseng, Kuei-Chu Hsu, and Chien Chou, "Full-field characterization of a twisted nematic liquid-crystal device using equivalence theorem of a unitary optical system," Appl. Opt. 51, 238-244 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-2-238

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