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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 20 — Jul. 10, 2012
  • pp: 4569–4573

Physical mechanism underlying temperature effects on phase retardation

W. Chen, W. Wang, Y. Zhang, S. Zhang, and X. Long  »View Author Affiliations


Applied Optics, Vol. 51, Issue 20, pp. 4569-4573 (2012)
http://dx.doi.org/10.1364/AO.51.004569


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Abstract

We report on the physical mechanism underlying the temperature dependence of phase retardation. Changes in refractive index and thickness of the wave plate are the two main contributions to phase retardation variations. Temperature-dependent changes in refractive index are described by Sellmeier’s equation. Constants in this equation need to be determined by fits to experimental data. A new high-precision instrument was used to measure phase retardation at various temperatures. Once determined, the fitting equation can be used to calculate the phase retardation at any temperature, and thus has implications for wave-plate industrial manufacturing.

© 2012 Optical Society of America

OCIS Codes
(140.1340) Lasers and laser optics : Atomic gas lasers
(260.1440) Physical optics : Birefringence
(260.3160) Physical optics : Interference

ToC Category:
Physical Optics

History
Original Manuscript: March 13, 2012
Revised Manuscript: May 15, 2012
Manuscript Accepted: May 23, 2012
Published: July 2, 2012

Citation
W. Chen, W. Wang, Y. Zhang, S. Zhang, and X. Long, "Physical mechanism underlying temperature effects on phase retardation," Appl. Opt. 51, 4569-4573 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-20-4569

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