OSA's Digital Library

Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 20 — Jul. 10, 2012
  • pp: 4891–4895

Single-shot parallel four-step phase shifting using on-axis Fizeau interferometry

D. G. Abdelsalam, Baoli Yao, Peng Gao, Junwei Min, and Rongli Guo  »View Author Affiliations

Applied Optics, Vol. 51, Issue 20, pp. 4891-4895 (2012)

View Full Text Article

Enhanced HTML    Acrobat PDF (613 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



The purposes of the paper are threefold: (1) to show the possibility to perform parallel phase-shifting Fizeau interferometry by using a quarter waveplate with high flatness as a reference, (2) to present a comparative study between the phase-shifting algorithm and the off-axis geometry in surface microtopography measurement, and (3) to show the advantages of using the proposed common path Fizeau interferometry over the quasi-common path Michelson interferometry in terms of accuracy in measurement. The compelling advantage of the proposed parallel phase-shifting Fizeau interferometric technique is the long-term stability that leads to measuring objects with a high degree of accuracy.

© 2012 Optical Society of America

OCIS Codes
(070.6110) Fourier optics and signal processing : Spatial filtering
(100.5090) Image processing : Phase-only filters
(170.0180) Medical optics and biotechnology : Microscopy
(180.0180) Microscopy : Microscopy

ToC Category:
Image Processing

Original Manuscript: March 20, 2012
Revised Manuscript: May 11, 2012
Manuscript Accepted: May 18, 2012
Published: July 9, 2012

Virtual Issues
Vol. 7, Iss. 9 Virtual Journal for Biomedical Optics

D. G. Abdelsalam, Baoli Yao, Peng Gao, Junwei Min, and Rongli Guo, "Single-shot parallel four-step phase shifting using on-axis Fizeau interferometry," Appl. Opt. 51, 4891-4895 (2012)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. M. Born and E. Wolf, Principles of Optics (Cambridge University, 1980), pp. 459–490.
  2. D. G. Abdelsalam and D. Kim, “Two-wavelength in-line phase-shifting based on polarizing separation for accurate surface profiling,” Appl. Opt. 50, 6153–6161 (2011). [CrossRef]
  3. Y. Awatsuji, M. Sasada, and T. Kubota, “Parallel quasi-phase-shifting digital holography,” Appl. Phys. Lett. 85, 1069–1071 (2004). [CrossRef]
  4. D. G. Abdelsalam and D. Kim, “Single-shot, dual-wavelength digital holography based on polarizing separation,” Appl. Opt. 50, 3360–3368 (2011). [CrossRef]
  5. T. Nomura, S. Murata, E. Nitanai, and T. Numata, “Phase-shifting digital holography with a phase difference between orthogonal polarizations,” Appl. Opt. 45, 4873–4877 (2006). [CrossRef]
  6. M. Novak, J. Millerd, N. Brock, M. North-Morris, J. Hayes, and J. Wyant, “Analysis of a micropolarizer array-based simultaneous phase-shifting interferometer,” Proc. SPIE 5531, 304–314 (2004). [CrossRef]
  7. D. G. Abdelsalam, M. S. Shaalan, and M. M. Eloker, “Surface microtopography measurement of a standard flat surface by multiple-beam interference fringes at reflection,” Optic. Laser. Eng. 48, 543–547 (2010). [CrossRef]
  8. D. G. Abdelsalam, M. S. Shaalan, M. M. Eloker, and D. Kim, “Radius of curvature measurement of spherical smooth surfaces by multiple-beam interferometry in reflection,” Opt. Lasers Eng. 48, 643–649 (2010).
  9. P. Gao, B. Yao, I. Harder, J. Min, R. Guo, J. Zheng, and T. Ye, “Parallel two-step phase-shifting digital holograph microscopy based on a grating pair,” J. Opt. Soc. Am. A 28, 434–440 (2011). [CrossRef]
  10. U. Kumar, B. Bhaduri, M. Kothiyal, and M. Krishna, “Two wavelength micro interferometry for 3-D surface profiling,” Opt. Lasers Eng. 47, 223–229 (2009). [CrossRef]
  11. Q. Kemao, “A simple phase unwrapping approach based on filtering by windowed fourier transform,” Opt. Laser Technol. 40, 1091–1098 (2008). [CrossRef]
  12. D. G. Abdelsalam, B. J. Baek, Y. J. Cho, and D. Kim, “Surface form measurement using single shot off-axis Fizeau interferometry,” J. Opt. Soc. Korea 14, 409–414 (2010). [CrossRef]
  13. P. Gao, B. Yao, J. Min, R. Guo, J. Zheng, T. Ye, I. Harder, V. Nercissian, and K. Mantel, “Parallel two-step phase-shifting point-diffraction interferometry for microscopy based on a pair of cube beamsplitters,” Opt. Express 19, 1930–1935 (2011). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited