|
Nanometer displacement measurement using Fresnel diffraction |
Applied Optics, Vol. 51, Issue 21, pp. 5066-5072 (2012)
http://dx.doi.org/10.1364/AO.51.005066
Enhanced HTML 
Acrobat PDF (1350 KB)
Abstract
We introduce a relatively simple and efficient optical technique to measure nanoscale displacement based on visibility variations of the Fresnel diffraction fringes from a two-dimensional phase step. In this paper we use our technique to measure electromechanical expansions by a thin piezoelectric ceramic and also thermal changes in the diameter of a tungsten wire. Early results provide convincing evidence that sensitivity up to a few nanometers can be achieved, and our technique has the potential to be used as a nanodisplacement probe.
© 2012 Optical Society of America
OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
ToC Category:
Diffraction and Gratings
History
Original Manuscript: January 17, 2012
Revised Manuscript: May 9, 2012
Manuscript Accepted: June 5, 2012
Published: July 12, 2012
Citation
Ali Akbar Khorshad, Khosrow Hassani, and Mohammad Taghi Tavassoly, "Nanometer displacement measurement using Fresnel diffraction," Appl. Opt. 51, 5066-5072 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-21-5066
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Wave-Front Sensing with a Sampling Field Sensor (AO)
- Feasibility of an Airborne TV Camera as a Size Spectrometer for Cloud Droplets in Daylight (AO)
- Improved Angle Interferometer Based on Total Internal Reflection (AO)
- General and Self-Consistent Method for the Calibration of Polarization Modulators, Polarimeters, and Mueller-Matrix Ellipsometers (AO)
- Gap Measurement by Position-Sensitive Detectors (AO)
Related Conference Papers
- Optical-Phase Stabilization of 1550-nm Mode-Locked Laser to Optical Atomic Clock with Application to Remote Transfer of Ultralow-Jitter Timing Signal
- Fiber Based Frequency Comb Lasers and Their Applications
- Ferrofluid Based Deformable Mirrors for Adaptive Optics
- Ferrofluid Based Deformable Mirrors for Adaptive Optics
- Use of Sequence of "Chirped" Femtosecond Pulses for Measurement of Small Surface Displacements
« Previous Article | Next Article »
OSA is a member of 