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Applied Optics

Applied Optics


  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 21 — Jul. 20, 2012
  • pp: 5100–5110

Dual-modulator broadband infrared Mueller matrix ellipsometry

Liam J. K. Cross and Dennis K. Hore  »View Author Affiliations

Applied Optics, Vol. 51, Issue 21, pp. 5100-5110 (2012)

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A broadband mid-infrared Mueller matrix ellipsometer is described based on two photoelastic modulators and a step-scan interferometer. The data are analyzed using a combination hardware–software double Fourier transformation. Obtaining spectra of the Mueller matrix elements requires that the infrared wavelength-dependent retardation amplitude of the modulators be known through calibration and subsequently incorporated into the data processing. The spectroscopic capability of the instrument is demonstrated in transmission and reflection geometries by the measured Mueller matrices of air, an anisotropic quartz crystal, and the ZnSe–water interface, each from 25004000cm1.

© 2012 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(260.5430) Physical optics : Polarization

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: January 30, 2012
Revised Manuscript: April 13, 2012
Manuscript Accepted: May 11, 2012
Published: July 12, 2012

Liam J. K. Cross and Dennis K. Hore, "Dual-modulator broadband infrared Mueller matrix ellipsometry," Appl. Opt. 51, 5100-5110 (2012)

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