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Simultaneous determination of thickness and refractive index based on time-of-flight measurements of terahertz pulse |
Applied Optics, Vol. 51, Issue 21, pp. 5326-5330 (2012)
http://dx.doi.org/10.1364/AO.51.005326
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Abstract
We present a simple technique for simultaneous determination of thickness and refractive index of plane-parallel samples in the terahertz radiation domain. The technique uses time-of-flight measurements of the terahertz pulse. It has been employed on nine different polymers and semiconductor materials, which are transparent for terahertz frequencies. Our results of thickness measurement are in good agreement with micrometer reading. The accuracy in the determination of refractive index is on the order of two decimal points.
© 2012 Optical Society of America
OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(290.3030) Scattering : Index measurements
(040.2235) Detectors : Far infrared or terahertz
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: April 20, 2012
Revised Manuscript: June 19, 2012
Manuscript Accepted: June 20, 2012
Published: July 20, 2012
Citation
Babar Hussain, Mushtaq Ahmed, M. Nawaz, M. Saleem, M. Razzaq, M. Aslam Zia, and M. Iqbal, "Simultaneous determination of thickness and refractive index based on time-of-flight measurements of terahertz pulse," Appl. Opt. 51, 5326-5330 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-21-5326
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