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Frequency spurious aversion by minimal reverse bias selection of a high-speed optically triggered sampling circuit based on a positive–intrinsic–negative photodiode |
Applied Optics, Vol. 51, Issue 22, pp. 5412-5418 (2012)
http://dx.doi.org/10.1364/AO.51.005412
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Abstract
In this paper we present a procedure for the selection of the minimal dc reverse bias voltage of a high-speed optically triggered sampling circuit. The optically triggered sampling circuit is based on a PIN photodiode. A set of expressions that includes the optical power dependence of the current passing through the PIN photodiode is derived. Theoretical results of the procedure are experimentally verified with practical measurements obtained from a 3 giga samples per second (GS/s) and a
© 2012 Optical Society of America
OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(230.2090) Optical devices : Electro-optical devices
(250.0250) Optoelectronics : Optoelectronics
ToC Category:
Optoelectronics
History
Original Manuscript: May 9, 2012
Revised Manuscript: June 18, 2012
Manuscript Accepted: June 19, 2012
Published: July 25, 2012
Citation
Carlos Villa, Iván Olaf Hernandez, Rafael Villa, and Eric Donkor, "Frequency spurious aversion by minimal reverse bias selection of a high-speed optically triggered sampling circuit based on a positive–intrinsic–negative photodiode," Appl. Opt. 51, 5412-5418 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-22-5412
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