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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 22 — Aug. 1, 2012
  • pp: 5512–5516

Wavenumber scanning-based Fourier transform white-light interferometry

Zhen Wang and Yi Jiang  »View Author Affiliations


Applied Optics, Vol. 51, Issue 22, pp. 5512-5516 (2012)
http://dx.doi.org/10.1364/AO.51.005512


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Abstract

Fourier transform white-light interferometry recovers the optical path difference of an interferometer by measuring the phase change caused by scanning wavelength. However, the optical spectrum, obtained by wavelength scanning method (λ-method), contains a chirp in period. The chirp would induce deviation and decrease the measurement accuracy. An improved method, the wavenumber scanning method (k-method), is proposed and experimentally demonstrated, in which there is no chirp in the optical spectrum. The measurement results using the k-method and the λ-method are compared experimentally. The experimental results show that the standard deviation of the measurement results decreases from 0.015 to 0.004 μm, when an extrinsic Fabry–Perot interferometer with a cavity length of 387 μm is interrogated.

© 2012 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(120.2230) Instrumentation, measurement, and metrology : Fabry-Perot
(120.3180) Instrumentation, measurement, and metrology : Interferometry

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: May 29, 2012
Manuscript Accepted: July 2, 2012
Published: July 30, 2012

Citation
Zhen Wang and Yi Jiang, "Wavenumber scanning-based Fourier transform white-light interferometry," Appl. Opt. 51, 5512-5516 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-22-5512

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