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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Editor: Joseph N. Mait
  • Vol. 51, Iss. 24 — Aug. 20, 2012
  • pp: 5773–5779

High-resolution electronic interferometry for the measurement of in-plane vibration

Ching-Yuan Chang, Shih-Hao Lin, and Chien-Ching Ma  »View Author Affiliations


Applied Optics, Vol. 51, Issue 24, pp. 5773-5779 (2012)
http://dx.doi.org/10.1364/AO.51.005773


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Abstract

This study proposes an algorithm based on the standard deviation in the temporal domain to remove influences from background noise and ambient disturbance and enhance the quality of images obtained using interferometric technology. From measurements of the first ten in-plane resonant frequencies and mode shapes of vibrating zirconate titanate (PZT) laminates, we investigated the resonant characteristics in both the U and V directions. The resulting interference fringes were used to quantify the vibration amplitude of PZT plates on a submicron scale. The resonant frequencies obtained using the proposed method are in excellent agreement with those obtained using the finite element method and an impedance analyzer.

© 2012 Optical Society of America

OCIS Codes
(030.4280) Coherence and statistical optics : Noise in imaging systems
(100.2650) Image processing : Fringe analysis
(100.2980) Image processing : Image enhancement
(120.7280) Instrumentation, measurement, and metrology : Vibration analysis
(100.3175) Image processing : Interferometric imaging

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 30, 2012
Revised Manuscript: June 28, 2012
Manuscript Accepted: June 29, 2012
Published: August 13, 2012

Citation
Ching-Yuan Chang, Shih-Hao Lin, and Chien-Ching Ma, "High-resolution electronic interferometry for the measurement of in-plane vibration," Appl. Opt. 51, 5773-5779 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-24-5773


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References

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