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Atomic-level study of a thickness-dependent phase change in gold thin films heated by an ultrafast laser |
Applied Optics, Vol. 51, Issue 24, pp. 5946-5951 (2012)
http://dx.doi.org/10.1364/AO.51.005946
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Abstract
An ultrafast laser-induced phase change in gold thin films with different thicknesses has been simulated by the method of coupling the two-temperature model and the molecular dynamics, including transient optical properties. Numerical results show that the decrease of film thickness leads to faster melting in the early nonequilibrium time and a larger melting depth. Moreover, earlier occurrence and a higher rate of resolidification are observed for the thicker film. Further analysis reveals that the mechanism for the thickness-dependent phase change in the films is the fast electron thermal conduction in the nonequilibrium state.
© 2012 Optical Society of America
OCIS Codes
(140.3330) Lasers and laser optics : Laser damage
(140.3390) Lasers and laser optics : Laser materials processing
(140.6810) Lasers and laser optics : Thermal effects
(320.7090) Ultrafast optics : Ultrafast lasers
(320.7130) Ultrafast optics : Ultrafast processes in condensed matter, including semiconductors
ToC Category:
Ultrafast Optics
History
Original Manuscript: May 31, 2012
Revised Manuscript: July 26, 2012
Manuscript Accepted: July 27, 2012
Published: August 20, 2012
Citation
Yong Gan, Jixiang Shi, and Shan Jiang, "Atomic-level study of a thickness-dependent phase change in gold thin films heated by an ultrafast laser," Appl. Opt. 51, 5946-5951 (2012)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-51-24-5946
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